Services
The FacilityThe NNTTF state-of-the-art test facility provides a high quality service to its customers. With the equipment located in Perth, Western Australia, the NNTTF is offering test services to Australian users. It is also open to other users using the difference in time zones around the globe. The ServicesRemote access places users virtually in front of the tester and gives them complete control.
The specifications of the daughter board are available from the NNTTF central facility. The EnvironmentThe NNTTF is equipped with a Verigy 93000 SOC P1000 tester. This platform available for SOC characterisation meets the need of production testing with the following features::
The NNTTF Verigy 93000 SOC tester also includes integrated, high performance analogue instrumentation. The combined digital and analogue test capabilities make the 93000 Series ideal for testing the most demanding Systems on a Chip comprising digital, memory and mixed-signal functionality.
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Daughterboard SpecificationsRead Me (.pdf) CharacterisationThe NNTTF maintains a unique environment to enhance any industry's competitive advantage through access to state of the art test equipment. You can fully characterize devices and better understand how they will react both functionally and thermally once packaged. Knowing this at the beginning of the design phase helps designers make better decisions for a superior performing end product. IP ValidationNNTTF sets a benchmark for Intellectual Property Validation with services like the ASIC design validation or the FPGA based board allowing users to perform a remote at-speed validation of IPs. Validation time drops from days to few minutes allowing further investigations of expected FPGA timing issues in a complex design under development. Users will also be able to thoroughly investigate real board-level timing margins at the I/O before the system level board is develop. TestingThe NNTTF has a Verigy 93000 SOC P1000 Series that meets the needs of SOC production testing with 512 digital pins, each with data rate of 1 Gbit/s. For Scan testing there are 16 channels providing 112M Vectors of deep memory per pin. With the NP2500 option, using true differential drivers/receivers and source synchronous tracking, users have the capability to debug, characterize and prepare for production test on 16 high-speed channels up to 2.5Gbit/s. The 93000 SOC Series also includes integrated, high performance analogue instrumentation. The combined digital and analogue test capability make the NNTTF Test Facility ideal for testing the most demanding Systems on a Chip comprising digital and mixed-signal functionalities. |